Fundamentals of Electromigration-Aware Integrated Circuit Design
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The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
| Autor: | Lienig, Jens |
| Nakladatel: | Springer International Publishing AG |
| ISBN: | 9783319735573 |
| Rok vydání: | 2018 |
| Jazyk : | Angličtina |
| Vazba: | Hardback |
| Počet stran: | 159 |
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