Measurement Techniques for Radio Frequency Nanoelectronics
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1. An introduction to radio frequency nanoelectronics; 2. Core concepts of microwave and RF measurements; 3. Extreme-impedance measurements; 4. On-wafer measurements of RF nanoelectronic devices; 5. Modeling and validation of RF nanoelectronic devices; 6. Characterization of nanofiber devices; 7. Instrumentation for near-field scanning microwave microscopy; 8. Probe-based measurement systems; 9. Radio frequency scanning probe measurements of materials; 10. Measurement of active nanoelectronic devices; 11. Dopant profiling in semiconductor nanoelectronics; 12. Depth profiling; 13. Dynamics of nanoscale magnetic systems; 14. Nanoscale electromagnetic measurements for life science applications.
Autor: | Wallis, T. Mitch |
Nakladatel: | Cambridge University Press |
Rok vydání: | 2017 |
Jazyk : | Angličtina |
Vazba: | Hardback |
Počet stran: | 320 |
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