Scanning Electron Microscopy and X-ray Microanalysis
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2569 Kč 2 705 Kč
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An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.
Autor: | Goldstein Joseph |
Nakladatel: | Springer Science+Business Media |
ISBN: | 9780306472923 |
Rok vydání: | 2007 |
Jazyk : | Angličtina |
Vazba: | Mixed media product |
Počet stran: | 689 |
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